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Fall 2016 Semester
Jan 21, 2019
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EECE 7339 - Testing and Design for Testability
Encompasses the theoretical and practical aspects of digital systems testing and the design of easily testable circuits. Topics include defect and fault models, test generation for combinational and sequential circuits, testing measures and costs, functional and parametric test methods, design for testability, built-in self-test, and concurrent testing. Provides the foundations for developing test methods for digital systems and provides the techniques necessary to practice design for testability.
4.000 Credit hours
4.000 Lecture hours

Levels: Graduate
Schedule Types: Lecture

Electrical and Comp Engineerng Department

Course Attributes:
GSEN Engineering

Restrictions:
Must be enrolled in one of the following Levels:     
      Graduate

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